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Lattice Strain Distribution in SiGe Films Grown on Si (100) Substrate Measured by X-ray Diffraction
https://doi.org/10.24729/00008303
https://doi.org/10.24729/00008303df0c5b36-fa0e-4025-9ea9-10504ef04c99
名前 / ファイル | ライセンス | アクション |
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2009203323.pdf (272.9 kB)
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Item type | 紀要論文 / Departmental Bulletin Paper(1) | |||||
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公開日 | 2010-04-02 | |||||
タイトル | ||||||
タイトル | Lattice Strain Distribution in SiGe Films Grown on Si (100) Substrate Measured by X-ray Diffraction | |||||
言語 | ||||||
言語 | eng | |||||
資源タイプ | ||||||
資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||
資源タイプ | departmental bulletin paper | |||||
ID登録 | ||||||
ID登録 | 10.24729/00008303 | |||||
ID登録タイプ | JaLC | |||||
著者 |
Araki, Tsutomu
× Araki, Tsutomu× Fujimura, Norifumi× Ito, Taichiro |
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引用 | ||||||
内容記述タイプ | Other | |||||
内容記述 | Bulletin of Osaka Prefecture University. Series. A, Engineering and natural sciences. 1996, 45(1), p.27-30 | |||||
書誌情報 |
Bulletin of Osaka Prefecture University. Series. A, Engineering and natural sciences 巻 45, 号 1, p. 27-30, 発行日 1996-09-30 |
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ISSN | ||||||
収録物識別子タイプ | ISSN | |||||
収録物識別子 | 1342-3258 | |||||
書誌レコードID | ||||||
収録物識別子タイプ | NCID | |||||
収録物識別子 | AA1114925X | |||||
フォーマット | ||||||
内容記述タイプ | Other | |||||
内容記述 | application/pdf | |||||
著者版フラグ | ||||||
出版タイプ | VoR | |||||
出版タイプResource | http://purl.org/coar/version/c_970fb48d4fbd8a85 | |||||
出版者 | ||||||
出版者 | 大阪府立大学 |